Title :
When two worlds merge [test issues for system-level ICs]
Author_Institution :
LTX. Corp., USA
Abstract :
The rapid integration of large-scale mixed-signal and digital IC designs has created entirely new demands on test engineers and test equipment manufacturers. There are three areas of most concern when considering the changes that must take place in the test community to accommodate this technology shift. These are: test techniques, test equipment capabilities and time to market. Each of these are briefly discussed
Keywords :
automatic test equipment; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; standardisation; digital IC; large-scale mixed-signal IC; rapid integration; standardization; system-on-a-chip IC; technology shift; test equipment capabilities; test techniques; time to market; universal test platform;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743323
