DocumentCode

2527864

Title

Scaling deeper to submicron: on-line testing to the rescue

Author

Nicolaidis, M.

Author_Institution

TIMA

fYear

1998

fDate

18-23 Oct. 1998

Firstpage

1139

Lastpage

1139

Keywords

CMOS process; Circuit testing; Costs; Earth; Energy states; Frequency; Low voltage; Neutrons; Noise reduction; Single event transient;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC, USA

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743330

Filename

743330