DocumentCode :
2527915
Title :
Experimental optimization of an anisotropic etching process for random texturization of silicon solar cells
Author :
King, David L. ; Buck, M. Elaine
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
fYear :
1991
fDate :
7-11 Oct 1991
Firstpage :
303
Abstract :
A multifactor experimental investigation of silicon surface texturing was conducted using aqueous potassium-hydroxide (KOH) solutions with isopropyl alcohol (IPA) added as a complexing agent. Czochralski, magnetic-Czochralski, and float-zone silicon wafers of different resistivities with both polished and lapped surfaces were included in the experiment. Process variables considered were solution temperature, time in solution, degree of mechanical mixing, KOH concentration, and IPA concentration. Using hemispherical reflectance as the primary gauge of success, process variables that resulted in an effective surface texture with reflectance less than 12% prior to antireflection coating were identified. Of particular interest was a low-temperature (70°C) process with less than 2% concentration of both KOH and IPA and wide process variable tolerances
Keywords :
elemental semiconductors; etching; silicon; solar cells; texture; Czochralski wafers; KOH; Si solar cells; anisotropic etching process; degree of mechanical mixing; float-zone wafers; hemispherical reflectance; isopropyl alcohol; lapped surfaces; magnetic-Czochralski wafers; random texturization; semiconductor; solution temperature; time in solution; Anisotropic magnetoresistance; Coatings; Conductivity; Etching; Magnetic anisotropy; Perpendicular magnetic anisotropy; Reflectivity; Silicon; Surface texture; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
Type :
conf
DOI :
10.1109/PVSC.1991.169228
Filename :
169228
Link To Document :
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