DocumentCode
2528008
Title
Amorphous silicon edge detector for application to electronic eyes
Author
Wen-Jyh Sah ; Si-Chen Lee ; Jyh-Hong Chen
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
1989
fDate
3-6 Dec. 1989
Firstpage
515
Lastpage
518
Abstract
Two types of novel a-Si:H edge detectors, i.e. concentric and directional ones, are successfully fabricated. The measured performance of the edge detector is similar to that of the resistor network Si retina using analog VLSI technology. Two- and three-dimensional architectures of the a-Si:H image detection array combined with the Si VLSI technology are also discussed with application to the preprocessor for a smart vision system.<>
Keywords
VLSI; amorphous semiconductors; computer vision; elemental semiconductors; hydrogen; image sensors; silicon; Si retina; VLSI technology; amorphous Si:H edge detectors; concentric edge detectors; directional edge detectors; electronic eyes; image detection array; preprocessor; smart vision system; three-dimensional architectures; two-dimensional architectures; Amorphous silicon; Detectors; Eyes; Image edge detection; Machine vision; Photoconductivity; Pixel; Resistors; Retina; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-0817-4
Type
conf
DOI
10.1109/IEDM.1989.74334
Filename
74334
Link To Document