DocumentCode :
2528036
Title :
Learning to knit SOCs profitably
Author :
Rockoff, Todd
Author_Institution :
SIMD Solutions Inc., USA
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
1142
Abstract :
General solutions for SOC (System-on-Chip) test appear to demand new models of partnership among core designers, system integrators, test system manufacturers, test engineers. and process engineers. Each of these partners possesses unique value to contribute to the fundamental understanding that will enable the successful management of the interactions among disparate circuits. Progress towards this goal of cooperation is hastened to the extent that the partners adopt standard practices, which trade off small restrictions in flexibility against large decreases in time to revenue through test. The opportunity before our industry is to identify conditions that allow reasonable semiconductor product performance while also providing a degree of regularity that is sufficient for EDA tools to achieve the required testability. However, the EDA vendors cannot be expected to figure out solutions to all of the problems; they need help from the rest of the industry. Well-supported standards activities provide a means for gleaning lessons from the pioneering visionaries who lead the industry. The potential rewards for those who teach themselves and their partners how to achieve the boldest vision of SOC are tremendous
Keywords :
application specific integrated circuits; design for manufacture; design for testability; electronic design automation; integrated circuit design; integrated circuit manufacture; integrated circuit testing; cooperation need; electronic design automation tools; interactions among disparate circuits; organisational barriers; required testability; semiconductor product performance; standard practices; system-on-chip test; Circuit testing; Design engineering; Electronic design automation and methodology; Manufacturing processes; Semiconductor device testing; Standards activities; System testing; System-on-a-chip; Systems engineering and theory; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743342
Filename :
743342
Link To Document :
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