Title :
On-chip versus off-chip test: an artificial dichotomy
Author :
Aitken, Robert C.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Abstract :
There has been some recent interest in the subject of whether circuits should be tested with built-in self-test (BIST) or automated test equipment (ATE). As with many such debates, neither extreme is a viable position, and the true answer lies somewhere in the middle. BIST patterns have their place with scan patterns, IDDQ patterns, etc. as part of a test program driven by ATE
Keywords :
application specific integrated circuits; automatic test pattern generation; boundary scan testing; built-in self test; fault diagnosis; integrated circuit testing; ATE driven test program; ATPG; IDDQ patterns; automated test equipment; built-in self-test; diagnosis capability; large ASIC design; multiple cores on chip; off-chip test; on-chip test; overall timing accuracy; scan patterns; system level integration test; Automatic testing; Built-in self-test; Circuit testing; Clocks; Costs; Semiconductor device measurement; Silicon; Test equipment; Timing; Voltage;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743346
