DocumentCode
2528103
Title
BIST vs. ATE for testing system-on-a-chip
Author
Kelly, Neil
Author_Institution
LTX Corp., USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
1147
Abstract
The right combination of ATE and BIST will help to grow the system-on-a-chip market. Recognizing the strengths and weaknesses of each will be important in designing a complete test strategy that produces high quality devices at the lowest overall cost
Keywords
application specific integrated circuits; automatic test equipment; automatic testing; built-in self test; fault diagnosis; integrated circuit testing; ATE; BIST; complete test strategy design; component level test; embedded computing; redundancy analysis; system-level tests; system-on-a-chip testing; virtual component; Built-in self-test; Circuit testing; Costs; Crosstalk; Embedded computing; Logic testing; Printed circuits; Signal processing; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743347
Filename
743347
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