Title :
BIST vs. ATE for testing system-on-a-chip
Author_Institution :
LTX Corp., USA
Abstract :
The right combination of ATE and BIST will help to grow the system-on-a-chip market. Recognizing the strengths and weaknesses of each will be important in designing a complete test strategy that produces high quality devices at the lowest overall cost
Keywords :
application specific integrated circuits; automatic test equipment; automatic testing; built-in self test; fault diagnosis; integrated circuit testing; ATE; BIST; complete test strategy design; component level test; embedded computing; redundancy analysis; system-level tests; system-on-a-chip testing; virtual component; Built-in self-test; Circuit testing; Costs; Crosstalk; Embedded computing; Logic testing; Printed circuits; Signal processing; System testing; System-on-a-chip;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743347
