• DocumentCode
    2528190
  • Title

    A New Type of Dielectric Barrier Discharge Using Double Helical External Electrodes

  • Author

    Motomura, Hideki ; Muguruma, Yusuke ; Matsuda, Tatsuya ; Takubo, Shuji ; Jinno, Masafumi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Ehime Univ.
  • Volume
    2
  • fYear
    2006
  • fDate
    25-29 Sept. 2006
  • Firstpage
    616
  • Lastpage
    619
  • Abstract
    Xenon dielectric barrier discharges are expected to be useful as environmentally friendly light sources instead of that containing mercury. The authors have demonstrated new type of dielectric barrier discharge using double helical external electrodes (DHEL) method with xenon. The filling gas pressure ratio of Xe:Ne was 7:3, total pressure was 1.33 kPa and external electrode pitch was 10 mm. This DHEL was operated by sinusoidal waveform voltage, which is preferable to pulsed operation for preventing EMI, with enough phosphor luminance, i.e. 10 000 cd/m2. As a result of the observation of temporal behavior of the discharge by an ICCD camera, two discharges were observed in a half cycle of the sinusoidal input voltage. Moreover, it is found that the emission from the first discharge is intense on the electrode wire, whereas the intense emission position separates and repulsively moves to both sides of the electrode wire. This is explained from the repulsive force between the wall charge and the electrode polarity
  • Keywords
    CCD image sensors; brightness; discharges (electric); electrodes; phosphors; xenon; ICCD camera; dielectric barrier discharges; double helical external electrodes; electrode polarity; electrode wire; phosphor luminance; repulsive force; sinusoidal waveform voltage; xenon; Dielectrics; Electrodes; Electromagnetic interference; Fault location; Filling; Light sources; Phosphors; Voltage; Wire; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
  • Conference_Location
    Matsue
  • ISSN
    1093-2941
  • Print_ISBN
    1-4244-0191-7
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2006.357377
  • Filename
    4194958