How real is the new SIA roadmap for mixed-signal test equipment?

Author

Ortner, William R.

Author_Institution

Lucent Technol., Bell Labs., Allentown, PA, USA

fYear

1998

fDate

18-23 Oct 1998

Firstpage

1153

Abstract

The 1997 SIA roadmap for test equipment is summarized in two tables-Microprocessor and ASIC Test Equipment Requirements, for digital test, and Mixed Signal Test Equipment Requirements, for analog instrument requirements. The digital test equipment needs for mixed signal devices is expected to be the same as for purely digital devices. The clear trend for digital is toward higher pin count and higher speed and we fully expect to see complex analog functions on the same silicon with all this digital-the so called Systems-On-A-Chip. As a principal contributor and the coordinator for the SIA mixed signal test requirements, I would like to comment on how real the mixed signal roadmap appears one year later

Keywords

automatic test equipment; electronics industry; integrated circuit testing; mixed analogue-digital integrated circuits; 1997 SIA Roadmap; ATE requirements; analog instrument requirements; cost of test; mixed-signal test equipment; systems-on-a-chip; Application specific integrated circuits; Circuit testing; Costs; Instruments; Jitter; Microprocessors; Silicon; System testing; Test equipment; Throughput;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743352

Filename

743352