Title :
ESD failure finger-print-an effective and accurate method for root cause determination
Author :
Ting-Nguon, Tang ; Prancis, C. ; Swee-Thian, Teh
Author_Institution :
Device Anal. Lab., Adv. Micro Devices Export Sdn Bhd, Penang, Malaysia
Abstract :
Failure finger-print recognition is an effective and speedy method towards accurate root cause determination. This paper demonstrates the method of identifying ESD HBM and CDM failure finger-print through simulation on an EPROM. Through the use of CDM failure finger-print, the root cause of a catastrophic fallout was determined and corrective action effected
Keywords :
CMOS integrated circuits; EPROM; MOS integrated circuits; electrostatic discharge; failure analysis; fault location; integrated circuit reliability; integrated circuit testing; EPROM simulation; ESD CDM failure; ESD HBM failure; ESD failure fingerprint; IC failure analysis; catastrophic fallout; EPROM; Electrostatic discharge; Failure analysis; Packaging; Pins; Pulse measurements; Stress; System testing; Variable structure systems; Voltage;
Conference_Titel :
Physical & Failure Analysis of Integrated Circuits, 1997., Proceedings of the 1997 6th International Symposium on
Print_ISBN :
0-7803-3985-1
DOI :
10.1109/IPFA.1997.638154
