ESD failure finger-print-an effective and accurate method for root cause determination

Author

Ting-Nguon, Tang ; Prancis, C. ; Swee-Thian, Teh

Author_Institution

Device Anal. Lab., Adv. Micro Devices Export Sdn Bhd, Penang, Malaysia

fYear

1997

fDate

21-25 Jul 1997

Firstpage

115

Lastpage

120

Abstract

Failure finger-print recognition is an effective and speedy method towards accurate root cause determination. This paper demonstrates the method of identifying ESD HBM and CDM failure finger-print through simulation on an EPROM. Through the use of CDM failure finger-print, the root cause of a catastrophic fallout was determined and corrective action effected

Keywords

CMOS integrated circuits; EPROM; MOS integrated circuits; electrostatic discharge; failure analysis; fault location; integrated circuit reliability; integrated circuit testing; EPROM simulation; ESD CDM failure; ESD HBM failure; ESD failure fingerprint; IC failure analysis; catastrophic fallout; EPROM; Electrostatic discharge; Failure analysis; Packaging; Pins; Pulse measurements; Stress; System testing; Variable structure systems; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical & Failure Analysis of Integrated Circuits, 1997., Proceedings of the 1997 6th International Symposium on

Print_ISBN

0-7803-3985-1

Type

conf

DOI

10.1109/IPFA.1997.638154

Filename

638154

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2528302