DocumentCode
2528354
Title
Fast error detection through efficient use of hardwired resources in FPGAs
Author
Nazar, Gabriel L. ; Carro, Luigi
Author_Institution
Inst. de Inf., Univ. Fed. do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil
fYear
2012
fDate
28-31 May 2012
Firstpage
1
Lastpage
6
Abstract
Providing high reliability for FPGAs is a demanding task, as such devices may be subject to faults in the configuration bitstream, altering the specified function. Traditional modular redundancy remains the most used technique, due to its high fault coverage and low performance overhead. When high availability and strict real-time deadlines must be considered, however, a short mean time to repair also becomes crucial. The use of fine-grained modules can accelerate error detection, fault diagnosis and bitstream correction, but with increased area costs. In this work, we propose the use of hardwired resources found in state-of-the-art FPGAs to provide fast and area efficient fine-grained error detection. Experimental results show an average speed up in error detection of 7.68 times with only 3.2% more area overhead, when compared to coarse-grained modular redundancy.
Keywords
error detection; field programmable gate arrays; coarse-grained modular redundancy; fast error detection; fine-grained error detection; hardwired resource; state-of-the-art FPGA; Circuit faults; Delay; Field programmable gate arrays; Redundancy; Routing; Table lookup; Dual Modular Redundancy; Field Programmable Gate Array;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location
Annecy
Print_ISBN
978-1-4673-0696-6
Electronic_ISBN
978-1-4673-0695-9
Type
conf
DOI
10.1109/ETS.2012.6233005
Filename
6233005
Link To Document