Title : 
Increasing autonomous fault-tolerant FPGA-based systems´ lifetime
         
        
            Author : 
Bolchini, Cristiana ; Miele, Antonio ; Sandionigi, Chiara
         
        
            Author_Institution : 
Dipt. di Elettron. e Inf., Politec. di Milano, Milano, Italy
         
        
        
        
        
        
            Abstract : 
In this paper we propose an automated design flow for the implementation of autonomous fault-tolerant systems on SRAM-based FPGA platforms, able to cope with the occurrence of both transient and permanent faults. The goal of the proposed methodology is to increase the system´s lifetime, by designing it able to detect and mitigate the effects of soft errors, as well as of permanent, non-recoverable ones, by exploiting dynamic reconfiguration. The application of the hardening design flow to a real case study is reported, to validate the methodology.
         
        
            Keywords : 
SRAM chips; fault tolerance; field programmable gate arrays; SRAM-based FPGA platform; autonomous fault-tolerant FPGA-based system lifetime; dynamic reconfiguration; hardening design flow; soft error; Circuit faults; Field programmable gate arrays; Memory management; Payloads; Reliability; Transient analysis; Wires;
         
        
        
        
            Conference_Titel : 
Test Symposium (ETS), 2012 17th IEEE European
         
        
            Conference_Location : 
Annecy
         
        
            Print_ISBN : 
978-1-4673-0696-6
         
        
            Electronic_ISBN : 
978-1-4673-0695-9
         
        
        
            DOI : 
10.1109/ETS.2012.6233006