• DocumentCode
    2528387
  • Title

    Increasing autonomous fault-tolerant FPGA-based systems´ lifetime

  • Author

    Bolchini, Cristiana ; Miele, Antonio ; Sandionigi, Chiara

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milano, Italy
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper we propose an automated design flow for the implementation of autonomous fault-tolerant systems on SRAM-based FPGA platforms, able to cope with the occurrence of both transient and permanent faults. The goal of the proposed methodology is to increase the system´s lifetime, by designing it able to detect and mitigate the effects of soft errors, as well as of permanent, non-recoverable ones, by exploiting dynamic reconfiguration. The application of the hardening design flow to a real case study is reported, to validate the methodology.
  • Keywords
    SRAM chips; fault tolerance; field programmable gate arrays; SRAM-based FPGA platform; autonomous fault-tolerant FPGA-based system lifetime; dynamic reconfiguration; hardening design flow; soft error; Circuit faults; Field programmable gate arrays; Memory management; Payloads; Reliability; Transient analysis; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233006
  • Filename
    6233006