DocumentCode
2528389
Title
Predicting software black-box defects using stacked generalization
Author
Li, Ning ; Li, Zhanhuai ; Nie, Yanming ; Sun, Xiling ; Li, Xia
Author_Institution
Sch. of Comput. Sci. & Technol., Northwestern Polytech. Univ., Xi´´an, China
fYear
2011
fDate
26-28 Sept. 2011
Firstpage
294
Lastpage
299
Abstract
Defect number prediction is essential to make a key decision on when to stop testing. For more applicable and accurate prediction, we propose an ensemble prediction model based on stacked generalization (PMoSG), and use it to predict the number of defects detected by third-party black-box testing. Taking the characteristics of black-box defects and causal relationships among factors which influence defect detection into account, Bayesian net and other numeric prediction models are employed in our ensemble models. Experimental results show that our PMoSG model achieves a significant improvement in accuracy of defect numeric prediction than any individual model, and achieves best prediction accuracy when using LWL(Locally Weighted Learning) method as level-1 model.
Keywords
belief networks; generalisation (artificial intelligence); learning (artificial intelligence); program testing; software fault tolerance; Bayesian network; ensemble prediction model; locally weighted learning method; software black-box defect prediction; stacked generalization; third-party black-box testing; Bayesian methods; Data models; Numerical models; Predictive models; Software; Testing; Training; Bayesian net; black-box defects; numeric prediction; stacked generalization; third-party testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital Information Management (ICDIM), 2011 Sixth International Conference on
Conference_Location
Melbourn, QLD
ISSN
Pending
Print_ISBN
978-1-4577-1538-9
Type
conf
DOI
10.1109/ICDIM.2011.6093330
Filename
6093330
Link To Document