• DocumentCode
    2528402
  • Title

    Fault tolerant FPGA processor based on runtime reconfigurable modules

  • Author

    Psarakis, Mihalis ; Apostolakis, Andreas

  • Author_Institution
    Dept. of Inf., Univ. of Piraeus, Piraeus, Greece
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The increasing use of field programmable devices for the implementation of embedded processors and systems-on-chip even in mission-critical applications demands for fault tolerant techniques to improve reliability and extend system lifetime. Furthermore, the runtime partial reconfiguration potentials of the latest FPGA devices along with the availability of unused programmable resources in most FPGA designs provide interesting opportunities to build fault tolerant mechanisms. In this paper, we exploit the latest dynamic reconfiguration advances and propose a fault-tolerant FPGA processor architecture based on runtime reconfigurable modules. We partition the processor core into reconfigurable modules and duplicate these modules to implement a concurrent error detection mechanism. For every duplicated module we generate precompiled configurations which include spare resources and are used to runtime repair the defective module. The processor freezes upon the detection of an error and an on-chip controller coordinates the processor recovery and repair in a reconfiguration process transparent to the processor. We demonstrate the proposed approach in OpenRISC core, a widely-used open-source soft processor.
  • Keywords
    fault tolerance; field programmable gate arrays; OpenRISC core; concurrent error detection mechanism; defective module; dynamic reconfiguration; fault tolerant FPGA processor; fault-tolerant FPGA processor architecture; on-chip controller; open-source soft processor; processor core; runtime reconfigurable module; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Maintenance engineering; Pipelines; Runtime; FPGA processor; Field Programmable Gate Arrays (FPGAs); fault tolerant processor; runtime partial reconfiguration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233007
  • Filename
    6233007