• DocumentCode
    2528428
  • Title

    Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs

  • Author

    Laraba, Asma ; Stratigopoulos, Haralampos-G ; Mir, Salvador ; Naudet, Hervé ; Forel, Christophe

  • Author_Institution
    TIMA Lab., UJF, Grenoble, France
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The reduced code linearity test technique for pipeline ADCs consists in measuring some judiciously selected codes which contain the information about the linearity of the converter as opposed to the standard histogram technique that considers indiscriminately all codes. This technique dramatically reduces the static test time for pipeline ADCs. In this paper, we identify some limitations in the existing version of the technique and we provide solutions to enhance its accuracy. The enhanced technique is applied to a 12-bit 2.5-bit/stage pipeline ADC.
  • Keywords
    analogue-digital conversion; code linearity test technique; converter; multi-bit pipeline ADC; stage pipeline ADC; standard histogram technique; static test time; Computer architecture; Digital circuits; Dynamic range; Histograms; Linearity; Pipelines; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233009
  • Filename
    6233009