DocumentCode
2528428
Title
Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs
Author
Laraba, Asma ; Stratigopoulos, Haralampos-G ; Mir, Salvador ; Naudet, Hervé ; Forel, Christophe
Author_Institution
TIMA Lab., UJF, Grenoble, France
fYear
2012
fDate
28-31 May 2012
Firstpage
1
Lastpage
6
Abstract
The reduced code linearity test technique for pipeline ADCs consists in measuring some judiciously selected codes which contain the information about the linearity of the converter as opposed to the standard histogram technique that considers indiscriminately all codes. This technique dramatically reduces the static test time for pipeline ADCs. In this paper, we identify some limitations in the existing version of the technique and we provide solutions to enhance its accuracy. The enhanced technique is applied to a 12-bit 2.5-bit/stage pipeline ADC.
Keywords
analogue-digital conversion; code linearity test technique; converter; multi-bit pipeline ADC; stage pipeline ADC; standard histogram technique; static test time; Computer architecture; Digital circuits; Dynamic range; Histograms; Linearity; Pipelines; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location
Annecy
Print_ISBN
978-1-4673-0696-6
Electronic_ISBN
978-1-4673-0695-9
Type
conf
DOI
10.1109/ETS.2012.6233009
Filename
6233009
Link To Document