• DocumentCode
    2528440
  • Title

    Multi Pattern Dynamic Time Warping for automatic speech recognition

  • Author

    Nair, Nishanth Ulhas ; Sreenivas, T.V.

  • Author_Institution
    Dept. of Electr. Commun. Eng., Indian Inst. of Sci., Bangalore
  • fYear
    2008
  • fDate
    19-21 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We are addressing the problem of jointly using multiple noisy speech patterns for automatic speech recognition (ASR), given that they come from the same class. If the user utters a word K times, the ASR system should try to use the information content in all the K patterns of the word simultaneously and improve its speech recognition accuracy compared to that of the single pattern based speech recognition. To address this problem, recently we proposed a multi pattern dynamic time warping (MPDTW) algorithm to align the K patterns by finding the least distortion path between them. A constrained multi pattern Viterbi algorithm was used on this aligned path for isolated word recognition (IWR). In this paper, we explore the possibility of using only the MPDTW algorithm for IWR. We also study the properties of the MPDTW algorithm. We show that using only 2 noisy test patterns (10 percent burst noise at -5 dB SNR) reduces the noisy speech recognition error rate by 37.66 percent when compared to the single pattern recognition using the dynamic time warping algorithm.
  • Keywords
    Viterbi decoding; speech coding; speech recognition; Viterbi decoding algorithm; automatic speech recognition; isolated word recognition; least distortion path finding; multi pattern dynamic time warping algorithm; multiple noisy speech pattern; Automatic speech recognition; Error analysis; Hidden Markov models; Noise reduction; Pattern recognition; Signal to noise ratio; Speech analysis; Speech recognition; Testing; Viterbi algorithm; Automatic Speech Recognition; Dynamic Time Warping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2008 - 2008 IEEE Region 10 Conference
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4244-2408-5
  • Electronic_ISBN
    978-1-4244-2409-2
  • Type

    conf

  • DOI
    10.1109/TENCON.2008.4766617
  • Filename
    4766617