• DocumentCode
    252864
  • Title

    High power SiC inverter module packaging solutions for junction temperature over 220°C

  • Author

    Woo, D.R.M. ; Hwang How Yuan ; Li, J.A.J. ; Ho Siow Ling ; Lee Jong Bum ; Zhang Songbai ; Zhang Hengyun ; Selvaraj, S.L. ; Velez, S.D. ; Singh, R.P.

  • Author_Institution
    Inst. of Microelectron., Agency for Sci., Technol. & Res., Singapore, Singapore
  • fYear
    2014
  • fDate
    3-5 Dec. 2014
  • Firstpage
    31
  • Lastpage
    35
  • Abstract
    The SiC based high power 3 phase inverter module with double side cooling structure was developed. By applying flipchip bonding of SiC based high power DMOSFET device on DBC substrate, the source and gate bonding could be achieved. The drain interconnection was done by copper clip attach. The developed structure can provide the flat structure for both top and bottom surfaces, which can be effectively utilized for double side cooling design for high power heat dissipation. In addition to power module design with double side cooling capability, the high temperature endurable material set which can endure over 220°C device junction temperature such as high temperature interconnection, encapsulation and TIM (thermal interface materials) are developed and identified. Through the thermal, mechanical, electrical modeling & characterization and the reliability test for the developed functional test vehicles, the author could demonstrate the possibility of flip-chip based double side cooling capable high power module structure which can be utilized to high power and high temperature endurable applications for future wide band-gap device such as SiC and GaN based inverter modules.
  • Keywords
    cooling; flip-chip devices; logic gates; power MOSFET; semiconductor device models; semiconductor device reliability; silicon compounds; wide band gap semiconductors; DBC substrate; SiC; TIM; bottom surface; copper clip attach; developed functional test vehicles; device junction temperature; double-side cooling design; double-side cooling structure; drain interconnection; electrical modeling; encapsulation; flat structure; flipchip bonding; gate bonding; high-power 3-phase inverter module; high-power heat dissipation; high-power silicon carbide inverter module packaging solutions; high-temperature endurable material set; high-temperature interconnection; junction temperature; mechanical modeling; power module design; reliability test; silicon carbide-based high-power DMOSFET device; source bonding; thermal interface materials; thermal modeling; top surface; Electronic packaging thermal management; Inverters; Logic gates; Materials; Multichip modules; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2014 IEEE 16th
  • Conference_Location
    Singapore
  • Type

    conf

  • DOI
    10.1109/EPTC.2014.7028383
  • Filename
    7028383