• DocumentCode
    2528674
  • Title

    Influence of cell design on processing and performance for InP based solar cells

  • Author

    Pearsall, N.M. ; Sambell, A.J. ; Forbes, I. ; Burrage, J. ; Cross, T.A. ; Hardingham, C. ; McLeod, S. ; Jones, Mark W.

  • Author_Institution
    Photovoltaics Applications Centre, Newcastle Polytech., UK
  • fYear
    1991
  • fDate
    7-11 Oct 1991
  • Firstpage
    425
  • Abstract
    A comparison of homojunction and ITO/InP cells grown on the same substrate material is presented. Both cell types use a base region of MOVPE p-InP, grown under the same conditions. Cells of 4 cm2 in area of both types have been fabricated. Issues relating to the cell processing including junction formation and grid fabrication, are discussed. Although the homojunction cells currently exhibit superior performance in terms of efficiency and open circuit voltage, there exists much scope for optimization, particularly for the ITO/InP cells. Electrical characterization suggests a buried n+ /i/p structure for the ITO/InP cells, with i-layer thickness dependent on both processing and subsequent treatment. Post fabrication treatment of the cells is considered, in particular handling and interconnection. Ultrasonic bonding of foil interconnects appears to be a promising technique for both cell types
  • Keywords
    III-V semiconductors; indium compounds; p-n homojunctions; semiconductor device testing; solar cells; InP solar cells; MOVPE; buried n+/i/p structure; design; efficiency; foil interconnects; grid fabrication; handling; homojunction; interconnection; junction formation; open circuit voltage; optimization; performance; processing; semiconductor technology; substrate; ultrasonic bonding; Epitaxial growth; Epitaxial layers; Fabrication; Indium phosphide; Integrated circuit interconnections; Photovoltaic cells; Plasma temperature; Process design; Substrates; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-87942-636-5
  • Type

    conf

  • DOI
    10.1109/PVSC.1991.169251
  • Filename
    169251