DocumentCode :
252869
Title :
Thermal and mechanical reliability of low-temperature solder alloys for handheld devices
Author :
Ribas, Morgana ; Chegudi, Sujatha ; Kumar, Ajit ; Pandher, Ranjit ; Raut, Rahul ; Mukherjee, Sayan ; Sarkar, Santonu ; Singh, Bawa
Author_Institution :
Alpha Bangalore, Bangalore, India
fYear :
2014
fDate :
3-5 Dec. 2014
Firstpage :
366
Lastpage :
371
Abstract :
Low temperature alloys are used to achieve peak reflow temperatures from 170 to 200°C. Sn-Bi alloy stands as logic choices due to its low melting point, higher strength and low cost. However, use of Sn42-Bi58 alloy as soldering material is limited by a series of drawbacks such as low ductility, and poor thermal and mechanical reliability. Here we show how the use of micro-additives in eutectic Sn-Bi alloys improves thermal fatigue and mechanical shock properties. The basic properties of the new alloys shown here were fully characterized and their use in SMT applications evaluated, especially in drop shock and temperature cycling tests. Among the new alloys proposed, alloy B demonstrates superior mechanical properties, thermal cycling, drop shock and creep resistance, against benchmarks. Use of this new alloy in applications such as portable devices, PV ribbons and high efficiency LEDs will be highly beneficial due to its superior performance.
Keywords :
bismuth alloys; creep; eutectic alloys; reliability; shock wave effects; solders; thermal stress cracking; tin alloys; LEDs; PV ribbons; creep resistance; drop shock; eutectic alloys; handheld devices; low-temperature solder alloys; mechanical reliability; mechanical shock properties; microadditives; portable devices; thermal cycling; thermal fatigue; thermal reliability; Creep; Electric shock; Mechanical factors; Metals; Soldering; Testing; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2014 IEEE 16th
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/EPTC.2014.7028385
Filename :
7028385
Link To Document :
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