DocumentCode :
2528694
Title :
Improving multi-objective clustering through support vector machine: Application to gene expression data
Author :
Mukhopadhyay, Anirban ; Maulik, Ujjwal ; Bandyopadhyay, Sanghamitra
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Kalyani, Kalyani
fYear :
2008
fDate :
19-21 Nov. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Microarray technology facilitates the monitoring of the expression profile of a large number of genes across different experimental conditions simultaneously. This article proposes a novel approach that combines a recently proposed multiobjective fuzzy clustering scheme with support vector machine (SVM), to yield improved solutions. The multiobjective technique is first used to produce a set of non-dominated solutions. The non-dominated set is then used to find some high-confidence points using a fuzzy voting technique. The SVM classifier is trained by this high-confidence points. Finally the remaining points are classified using the trained classifier. Results demonstrating the effectiveness of the proposed technique are provided for three real life gene expression data sets. Moreover statistical significance test has been conducted to establish the significant superiority of the proposed technique.
Keywords :
bioinformatics; fuzzy set theory; genetics; learning (artificial intelligence); optimisation; pattern classification; pattern clustering; statistical testing; support vector machines; SVM classifier; fuzzy voting technique; gene expression data; machine learning; microarray technology; multiobjective fuzzy clustering; nondominated set; statistical significance test; support vector machine; Application software; Clustering algorithms; Computer science; Computerized monitoring; Condition monitoring; Gene expression; Machine intelligence; Support vector machine classification; Support vector machines; Testing; Fuzzy clustering; Pareto-optimality; Support Vector Machine; cluster validity measures; microarray gene expression data; multiobjective optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4244-2408-5
Electronic_ISBN :
978-1-4244-2409-2
Type :
conf
DOI :
10.1109/TENCON.2008.4766630
Filename :
4766630
Link To Document :
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