• DocumentCode
    2528705
  • Title

    Combining dynamic slicing and mutation operators for ESL correction

  • Author

    Repinski, Urmas ; Hantson, Hanno ; Jenihhin, Maksim ; Raik, Jaan ; Ubar, Raimund ; Guglielmo, Giuseppe Di ; Pravadelli, Graziano ; Fummi, Franco

  • Author_Institution
    Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Verification is increasingly becoming the bottleneck in designing digital systems. In fact, most of the verification cycle is not spent on detecting the occurrences of errors but on debugging, consisting of locating and correcting the errors. However, automated design-error debug, especially at the system-level, has received far less attention than error detection. Current paper presents an automated approach to correcting system-level designs. We propose dynamic-slicing and location-ranking-based method for accurately pinpointing the error locations combined with a dedicated set of mutation operators for automatically proposing corrections to the errors. In order to validate the approach, experiments on the Siemens benchmark set have been carried out. The experiments show that the proposed method is able to correct three times more errors compared to the state-of-the-art mutation-based correction methods while examining fewer mutants.
  • Keywords
    electronic design automation; error correction; error detection; ESL design correction automation; Siemens benchmark set; automated design-error debug; digital system design; dynamic slicing; electronic system-level design correction automation; error detection; error location; location-ranking-based method; mutation operator; verification cycle; Algorithm design and analysis; Benchmark testing; Circuit faults; Debugging; Error correction; Heuristic algorithms; System-level design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233020
  • Filename
    6233020