DocumentCode :
2528705
Title :
Combining dynamic slicing and mutation operators for ESL correction
Author :
Repinski, Urmas ; Hantson, Hanno ; Jenihhin, Maksim ; Raik, Jaan ; Ubar, Raimund ; Guglielmo, Giuseppe Di ; Pravadelli, Graziano ; Fummi, Franco
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
fYear :
2012
fDate :
28-31 May 2012
Firstpage :
1
Lastpage :
6
Abstract :
Verification is increasingly becoming the bottleneck in designing digital systems. In fact, most of the verification cycle is not spent on detecting the occurrences of errors but on debugging, consisting of locating and correcting the errors. However, automated design-error debug, especially at the system-level, has received far less attention than error detection. Current paper presents an automated approach to correcting system-level designs. We propose dynamic-slicing and location-ranking-based method for accurately pinpointing the error locations combined with a dedicated set of mutation operators for automatically proposing corrections to the errors. In order to validate the approach, experiments on the Siemens benchmark set have been carried out. The experiments show that the proposed method is able to correct three times more errors compared to the state-of-the-art mutation-based correction methods while examining fewer mutants.
Keywords :
electronic design automation; error correction; error detection; ESL design correction automation; Siemens benchmark set; automated design-error debug; digital system design; dynamic slicing; electronic system-level design correction automation; error detection; error location; location-ranking-based method; mutation operator; verification cycle; Algorithm design and analysis; Benchmark testing; Circuit faults; Debugging; Error correction; Heuristic algorithms; System-level design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
Type :
conf
DOI :
10.1109/ETS.2012.6233020
Filename :
6233020
Link To Document :
بازگشت