• DocumentCode
    2528728
  • Title

    Ultra-low voltage VLSI: are we there yet?

  • Author

    Ampadu, Paul

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rochester Univ., NY
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Lastpage
    24
  • Abstract
    Aggressively scaled supply voltage has been touted as one of the most powerful mechanisms for improving reliability and reducing power consumption in nanometer technologies. Sophisticated adaptive power management techniques vary supply voltage from nominal to ultra-low values to implement adaptive VLSI systems that gracefully respond to varying workload demands for improved energy efficiency. Unfortunately, ultra-low voltage (sub-volt for current technologies) operation has been constrained by performance limitations. In this paper, the current state of low-voltage VLSI design is evaluated; techniques for maintaining acceptable throughputs at ultra-low voltages are reviewed; and trends and prospects for ultra-low voltage VLSI systems are presented
  • Keywords
    VLSI; low-power electronics; adaptive VLSI system; adaptive power management; energy efficiency; nanometer technology; reducing power consumption; reliability; scaled supply voltage; ultra low voltage VLSI; varying workload demand; very large scale integration; Application software; Breakdown voltage; Circuits; Delay; Energy consumption; MOS devices; MOSFETs; Power system reliability; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
  • Conference_Location
    Island of Kos
  • Print_ISBN
    0-7803-9389-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2006.1692512
  • Filename
    1692512