Title :
Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test
Author :
Cook, Alejandro ; Hellebrand, Sybille ; Wunderlich, Hans-Joachim
Author_Institution :
Inst. of Comput. Archit. & Comput. Eng., Univ. of Stuttgart, Stuttgart, Germany
Abstract :
Efficient diagnosis procedures are crucial both for volume and for in-field diagnosis. In either case the underlying test strategy should provide a high coverage of realistic fault mechanisms and support a low-cost implementation. Built-in self-diagnosis (BISD) is a promising solution, if the diagnosis procedure is fully in line with the test flow. However, most known BISD schemes require multiple test runs or modifications of the standard scan-based test infrastructure. Some recent schemes circumvent these problems, but they focus on deterministic patterns to limit the storage requirements for diagnostic data. Thus, they cannot exploit the benefits of a mixed-mode test such as high coverage of non-target faults and reduced test data storage. This paper proposes a BISD scheme using mixed-mode patterns and partitioning the test sequence into “weak” and “strong” diagnostic windows, which are treated differently during diagnosis. As the experimental results show, this improves the coverage of non-target faults and enhances the diagnostic resolution compared to state-of-the-art approaches. At the same time the overall storage overhead for input and response data is considerably reduced.
Keywords :
built-in self test; fault diagnosis; mixed analogue-digital integrated circuits; BISD scheme; built-in self-diagnosis; diagnostic resolution; diagnostic windows; mixed-mode pattern; mixed-mode test; nontarget fault; strong diagnostic window; test sequence; weak diagnostic window; Built-in self-test; Circuit faults; Computer architecture; Equations; Fault location; Indexes; Memory; Built-in Diagnosis; Design for Diagnosis;
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
DOI :
10.1109/ETS.2012.6233025