Title :
Progress in the measurement of multi-junction devices at ISE [solar cell testing]
Author :
Heidler, Klaus ; Schönecker, Axel ; Müller-Bierl, Bernd ; Bücher, Klaus
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst., Freiburg, Germany
Abstract :
A reference solar cell method with software preselection of the simulator setting is discussed. This method has a high potential for reducing measurement time. The authors report the progress in setting up a triple source simulator for large-area solar cells with an in situ measurement of the spectrum using a calibrated spectroradiometer from 350 nm to 1500 nm. They present details of their high-precision spectral response facility for solar cells of up to 10×10 cm2 over a wavelength range of 320 nm to 1500 nm. An analysis is made of the propagation of systematic spectral uncertainties: typically a 10% spectral uncertainty leads to a 1.5% uncertainty in short-circuit current when the spectral mismatch method is used
Keywords :
automatic test equipment; p-n heterojunctions; semiconductor device testing; solar cells; test facilities; 320 to 1500 nm; 350 to 1500 nm; automatic testing; calibration; measurement; p-n heterojunctions; semiconductor device testing; short-circuit current; software; solar cell; spectral mismatch method; spectral response; spectral uncertainty; spectroradiometer; test facilities; Calibration; Circuit simulation; Energy measurement; Laboratories; Light sources; Measurement techniques; Photovoltaic cells; Short circuit currents; Solar energy; Testing;
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
DOI :
10.1109/PVSC.1991.169252