Title :
Secondary Electron Emission Measurement of Insulating Materials for Spacecraft
Author :
Miyake, Hiroaki ; Nitta, Kumi ; Michizono, Shinichiro ; Saito, Yoshio
Author_Institution :
Inst. of Aerosp. Technol., Inst. of Aerosp. Technol., Ibaraki
Abstract :
We studied how to measure the secondary electron emission (SEE) of metal and insulating materials used for satellite thermal insulation or other such purposes. SEE yield measurement is very important for analyzing charge accumulation on the satellite surfaces due to the space environment because electron emission due to irradiated electrons influences the amount of surface charge. Therefore, we tried to measure the SEE yield. To measure SEE, we used an improved SEM system for SEE measurement that has a beam blanking unit and a Faraday cup. From this system, we can obtain the characteristics of the SEE yield from insulation materials irradiated by an electron beam with energy of 600eV to 5keV. In this report, we introduce the SEE yield measurement results of reference materials (Au, Ag and quartz glass) and insulating materials. From those results, we discuss the characteristics of SEE that depend on each material. Furthermore, we also propose a future plan of SEE measurement for satellite materials
Keywords :
aerospace materials; electron beam effects; gold; quartz; secondary electron emission; silver; spacecraft charging; surface charging; thermal insulating materials; 0.6 to 5 keV; charge accumulation; electron beam irradiation; irradiated electrons; satellite surfaces; satellite thermal insulation; secondary electron emission measurement; space environment; spacecraft insulating materials; surface charge; yield measurement; Aircraft manufacture; Blanking; Charge measurement; Current measurement; Electron beams; Electron emission; Inorganic materials; Insulation; Satellites; Space charge;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
Conference_Location :
Matsue
Print_ISBN :
1-4244-0191-7
Electronic_ISBN :
1093-2941
DOI :
10.1109/DEIV.2006.357416