Title :
On-chip temperature and voltage measurement for field testing
Author :
Miura, Yukiya ; Sato, Yasuo ; Miyake, Yousuke ; Kajihara, Seiji
Abstract :
This paper proposes a novel technique to measure temperature and voltage on-chip in field test. It consists of three types of NBTI-tolerant ring oscillator and counters constructed with a standard cell library. Temperature and voltage are estimated with high accuracy and in a short time.
Keywords :
logic gates; logic testing; oscillators; temperature measurement; voltage measurement; NAND gate; NBTI-tolerant ring oscillator; field testing; on-chip temperature measurement; standard cell library; voltage measurement; Delay; Estimation; Mathematical model; Oscillators; Temperature measurement; Transistors; Voltage measurement; NTBI; aging; field testing; ring oscillators; temparature; voltage;
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
DOI :
10.1109/ETS.2012.6233035
