DocumentCode :
2529243
Title :
Adaptive testing: Conquering process variations
Author :
Yilmaz, Ender ; Ozev, Sule ; Sinanoglu, Ozgur ; Maxwell, Peter
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
fYear :
2012
fDate :
28-31 May 2012
Firstpage :
1
Lastpage :
6
Abstract :
Increasing process variations result in increasing statistical diversity in manufactured devices. Test plans that are developed without this diversity in mind are bound to result in poor test quality/yield and/or long test times. Adaptive testing is a general term that is used to tailor the test strategy to accommodate a wide range of variation in the statistical characteristics of manufactured devices. In this paper, we provide a review of the key works in both digital and analog domains.
Keywords :
integrated circuit testing; integrated circuit yield; statistical analysis; adaptive testing; analog domain; digital domain; long test times; manufactured devices; process variations; statistical characteristics; statistical diversity; test quality/yield; Correlation; Delay; Performance evaluation; Semiconductor device measurement; Temperature sensors; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
Type :
conf
DOI :
10.1109/ETS.2012.6233045
Filename :
6233045
Link To Document :
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