• DocumentCode
    2529243
  • Title

    Adaptive testing: Conquering process variations

  • Author

    Yilmaz, Ender ; Ozev, Sule ; Sinanoglu, Ozgur ; Maxwell, Peter

  • Author_Institution
    Arizona State Univ., Tempe, AZ, USA
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Increasing process variations result in increasing statistical diversity in manufactured devices. Test plans that are developed without this diversity in mind are bound to result in poor test quality/yield and/or long test times. Adaptive testing is a general term that is used to tailor the test strategy to accommodate a wide range of variation in the statistical characteristics of manufactured devices. In this paper, we provide a review of the key works in both digital and analog domains.
  • Keywords
    integrated circuit testing; integrated circuit yield; statistical analysis; adaptive testing; analog domain; digital domain; long test times; manufactured devices; process variations; statistical characteristics; statistical diversity; test quality/yield; Correlation; Delay; Performance evaluation; Semiconductor device measurement; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233045
  • Filename
    6233045