Title :
Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates
Author :
Hapke, F. ; Schloeffel, J.
Author_Institution :
Mentor Graphics, Hamburg, Germany
Abstract :
This tutorial will give an introduction to a new defect-oriented test method called cell-aware. This new cell-aware method takes the layout of standard library cells into account when creating the cell-aware ATPG library view. The tutorial will cover the whole cell-aware library characterization flow consisting of a layout extraction step, an analog fault simulation step of all cell-internal bridges and opens and the cell-aware synthesis step to create the new cell-aware ATPG library views, which finally can be used in a normal chip design flow to generate production test patterns. These cell-aware production test patterns have a significantly higher quality than state-of-the-art patterns. Finally, production test results from several hundred thousand tested IC´s are presented showing significant reduction of DPPM rates.
Keywords :
automatic test pattern generation; integrated circuit layout; integrated circuit testing; production testing; DPPM rates; analog fault simulation step; automatic test pattern generation; cell aware ATPG library view; cell aware library characterization flow; cell aware synthesis; cell internal bridges; defect oriented cell aware test methodology; defective parts per million; integrated circuit testing; layout extraction step; production test pattern generation; standard library cells; Automatic test pattern generation; Delay; Layout; Libraries; Production; Switching circuits; Transistors;
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
DOI :
10.1109/ETS.2012.6233046