Title :
VLSI Test technology: Why is the field not sexy enough?
Author :
Hamdioui, Said ; Aitken, Rob
Author_Institution :
Tech. Univ. Delft, Delft, Netherlands
Abstract :
Although it is an integral part of any manufactured chip and a crucial step to guarantee the required quality, VLSI Test technology seems to become less attractive/interesting for the research community. Funding bodies are minimizing their funding in the area, scientists are moving to other hot topics, industry is not seriously supporting academia in the field, etc.
Keywords :
VLSI; integrated circuit testing; VLSI test technology; manufactured chip; research community; Collaboration; Communities; Europe; Foundries; Industries; USA Councils; Very large scale integration;
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
DOI :
10.1109/ETS.2012.6233047
