Title :
Coupled SET pulses modeling based on LUT in ultra deep submicron technology
Author :
Shuming, Chen ; Biwei, Liu ; Bin, Liang
Author_Institution :
Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Changsha
Abstract :
Soft error induced by SET (single event transient) has been more and more substantial. It has been proved that previously decoupled SET pulse models will induce great error, such as double exponential model and piecewise linear model. In this paper, we present a novel LUT (look up table) based SET pulse model which can reflect the coupled effect of charge collection and circuit response. We realize this model in SPICE circuit simulator. Experiments show that the SET pulses obtained by our methods agree with device/circuit mix-mode simulation, and our method is much faster.
Keywords :
radiation effects; table lookup; LUT; charge collection; circuit response; coupled SET pulses modeling; look up table; single event transient; ultra deep submicron technology; Circuit simulation; Computer errors; Coupling circuits; Piecewise linear techniques; Pulse circuits; Pulse measurements; SPICE; Semiconductor device modeling; Table lookup; Voltage;
Conference_Titel :
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4244-2408-5
Electronic_ISBN :
978-1-4244-2409-2
DOI :
10.1109/TENCON.2008.4766665
