DocumentCode :
252934
Title :
Tunable 3D TSV-based inductor for integrated sensors
Author :
Kim, B. ; Mondal, S. ; Seok Ho Noh
Author_Institution :
Electr. Eng. Dept., City Univ. of New York, New York, NY, USA
fYear :
2014
fDate :
3-5 Dec. 2014
Firstpage :
322
Lastpage :
325
Abstract :
This paper describes the design and analysis of 3D through-silicon-via (TSV) inductors for integrated sensor applications. On-chip inductors are an integral part of small foot-print RF and analog chips. In an effort to further reduce foot-print, there have been numerous proposals of 3D TSV inductors. However, these inductors do not maintain higher quality factors due to the lossy silicon substrates through which the TSV must pass. We have designed and simulated a new structure to reduce losses through silicon substrates. Our novel structure tunes the inductors using TSV arrays for low-noise amplifiers. Through our simulation results, we were able to maintain a Q factor of approximately 5 on TSV-based inductors with excellent inductor values.
Keywords :
Q-factor; inductors; integrated circuit design; integrated circuit modelling; low noise amplifiers; sensors; three-dimensional integrated circuits; 3D through-silicon-via inductors; Si; TSV arrays; integrated sensor applications; low-noise amplifiers; on-chip inductors; quality factors; silicon substrates; tunable 3D TSV-based inductor; Inductance; Inductors; MOSFET; Metals; Q-factor; Three-dimensional displays; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2014 IEEE 16th
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/EPTC.2014.7028419
Filename :
7028419
Link To Document :
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