• DocumentCode
    2529459
  • Title

    FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design

  • Author

    Raik, Jaan

  • Author_Institution
    Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    DIAMOND project is set to cut development costs for Europe´s nanoelectronics industry by simplifying error diagnosis and correction in systems. The project reaches beyond current state-of-the-art by taking an integrated approach to localization and correction of different kinds of errors at various levels. In particular, DIAMOND has a focus on automated design error debug, soft error analysis and post-silicon in situ debug fields. The aim is to provide a holistic, systematic methodology and an integrated environment for diagnosis and correction of different types of errors. The DIAMOND consortium includes universities from Estonia, Sweden, Germany and Austria as well as large companies like IBM, Ericsson and two SMEs TransEDA and Testonica Lab. Here, we summarize the main achievements of the project so far.
  • Keywords
    error correction; integrated circuit design; integrated circuit reliability; nanoelectronics; DIAMOND project; FP7 collaborative research; automated design error debug; error correction; error modeling; nanoelectronics industry; post-silicon; reliable systems design; soft error analysis; Diamond-like carbon; Educational institutions; Error analysis; Europe; Industries; Nanoelectronics; System analysis and design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233052
  • Filename
    6233052