DocumentCode :
2529459
Title :
FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design
Author :
Raik, Jaan
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
fYear :
2012
fDate :
28-31 May 2012
Firstpage :
1
Lastpage :
1
Abstract :
DIAMOND project is set to cut development costs for Europe´s nanoelectronics industry by simplifying error diagnosis and correction in systems. The project reaches beyond current state-of-the-art by taking an integrated approach to localization and correction of different kinds of errors at various levels. In particular, DIAMOND has a focus on automated design error debug, soft error analysis and post-silicon in situ debug fields. The aim is to provide a holistic, systematic methodology and an integrated environment for diagnosis and correction of different types of errors. The DIAMOND consortium includes universities from Estonia, Sweden, Germany and Austria as well as large companies like IBM, Ericsson and two SMEs TransEDA and Testonica Lab. Here, we summarize the main achievements of the project so far.
Keywords :
error correction; integrated circuit design; integrated circuit reliability; nanoelectronics; DIAMOND project; FP7 collaborative research; automated design error debug; error correction; error modeling; nanoelectronics industry; post-silicon; reliable systems design; soft error analysis; Diamond-like carbon; Educational institutions; Error analysis; Europe; Industries; Nanoelectronics; System analysis and design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
Type :
conf
DOI :
10.1109/ETS.2012.6233052
Filename :
6233052
Link To Document :
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