Title :
Degradation of Si high-speed photodiodes by irradiation induced defects and restoration at low temperature
Author :
Laird, Jamie S. ; Hirao, Toshio ; Onoda, Shinobu ; Kamiya, Tomihiro
Keywords :
Bandwidth; Capacitance; Dark current; Degradation; Electrons; Photoconductivity; Photodiodes; Signal restoration; Signal to noise ratio; Temperature;
Conference_Titel :
Numerical Simulation of Semiconductor Optoelectronic Devices, 2003. NUSOD 2003. Proceedings of the IEEE/LEOS 3rd International Conference on
Print_ISBN :
0-7803-7992-6
DOI :
10.1109/NUSOD.2003.1263225
