• DocumentCode
    2529958
  • Title

    Degradation of Si high-speed photodiodes by irradiation induced defects and restoration at low temperature

  • Author

    Laird, Jamie S. ; Hirao, Toshio ; Onoda, Shinobu ; Kamiya, Tomihiro

  • fYear
    2003
  • fDate
    Oct. 14-16, 2003
  • Keywords
    Bandwidth; Capacitance; Dark current; Degradation; Electrons; Photoconductivity; Photodiodes; Signal restoration; Signal to noise ratio; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Simulation of Semiconductor Optoelectronic Devices, 2003. NUSOD 2003. Proceedings of the IEEE/LEOS 3rd International Conference on
  • Print_ISBN
    0-7803-7992-6
  • Type

    conf

  • DOI
    10.1109/NUSOD.2003.1263225
  • Filename
    1263225
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2529958