• DocumentCode
    2530097
  • Title

    Accelerometer using MOSFET with movable gate electrode: Electroplating thick nickel proof mass on flexible Parylene beam for enhancing sensitivity

  • Author

    Aoyagi, S. ; Suzuki, M. ; Kogure, J. ; Kong, T. ; Taguchi, R. ; Takahashi, T. ; Yokoyama, S. ; Tokunaga, H.

  • Author_Institution
    Kansai Univ., Suita, Japan
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    2030
  • Lastpage
    2033
  • Abstract
    This paper proposes an accelerometer based on metal-oxide-semiconductor field effect transistor (MOSFET), the gate electrode of which is movable because it is suspended by a flexible Parylene beam. When acceleration is applied, the gate is moved due to inertia force, making the change in drain current. It is notable that any external amplifying circuitry is not required, since the device itself acts as an electrical transistor besides a mechanical sensing structure. The fabrication starts from a conventional MOSFET, which is preferable in terms of CMOS compatibility and fabrication cost. For increasing the sensitivity, in the present paper, a thick nickel (Ni) proof mass was successfully electroplated on a flexible Parylene beam. It was proven that the proposed MOSFET-type accelerometer surely detects gravitational acceleration.
  • Keywords
    CMOS integrated circuits; MOSFET; accelerometers; electrodes; electroplating; nickel; polymers; MOSFET; Ni; accelerometer; amplifying circuitry; electroplating thick nickel proof mass; flexible Parylene beam; gravitational acceleration detection; inertia force; mechanical sensing structure; metal-oxide-semiconductor field effect transistor; movable gate electrode; sensitivity enhancement; Accelerometers; Electrodes; Fabrication; Logic gates; MOSFET circuits; Nickel; Sensors; Accelerometer; Electroplating; MOSFET; Parylene;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969210
  • Filename
    5969210