Title :
A mode-matched 0.9 MHZ single proof-mass dual-axis gyroscope
Author :
Sung, W.K. ; Dalal, M. ; Ayazi, F.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper reports on the design, fabrication, and characterization of a high-frequency single proof-mass dual-axis gyroscope. The hollow-disk pitch-and-roll resonant gyroscope has electrostatically tunable in-plane and out-of-plane resonance modes to enable mode-matched operation at ~ 0.9MHz in the presence of process non-idealities such as thickness variations of the SOI wafer. A prototype device demonstrates x- and y-axis rate sensitivity of 127μV/deg/sec and 214μV/deg/sec, respectively. High quality factors (Q) of ~ 10,000 are observed in vacuum for the in-plane drive and out-of-plane sense resonance modes. The device is implemented using a revised version of the HARPSS™ process, thereby enabling a single-chip tri-axial implementation when integrated with a yaw disk gyroscope.
Keywords :
Q-factor; gyroscopes; silicon-on-insulator; HARPSS process; SOI wafer; Si; electrostatically tunable in-plane resonance mode; electrostatically tunable out-of-plane resonance mode; frequency 0.9 MHz; hollow-disk pitch-and-roll resonant gyroscope; mode-matched single proof-mass dual-axis gyroscope; quality factor; single-chip triaxial implementation; thickness variation; x-axis rate sensitivity; y-axis rate sensitivity; yaw disk gyroscope; Electrodes; Frequency measurement; Gyroscopes; Q factor; Resonant frequency; Sensitivity; Tuning; Gyroscope; IMU; high frequency; mode-matching; pitch-and-roll; rate sensor;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0157-3
DOI :
10.1109/TRANSDUCERS.2011.5969229