Title :
A one-shot projection method for interconnects with process variations
Author :
Jun Tao ; Xuan Zeng ; Yang, Fan ; Su, Yangfeng ; Feng, Lihong ; Cai, Wei ; Zhou, Dian ; Chiang, Charles
Author_Institution :
Dept. of Microelectron., Fudan Univ., Shanghai
Abstract :
With the development of IC technology, it becomes urgent to investigate model reduction method for interconnects with process variations. In this paper, a one-shot projection algorithm (OPM) is proposed to generate a projection matrix that is independent of statistically varying parameters. As a result, construction of the reduced system can be decoupled with the Monte Carlo analysis in either frequency domain or time domain. Therefore, without loss of accuracy, OPM can obtain a reduced system in much less CPU time compared with the previous perturbation scheme. Numerical results have demonstrated the advantages of the proposed OPM
Keywords :
Monte Carlo methods; integrated circuit interconnections; integrated circuit modelling; perturbation techniques; reduced order systems; Monte Carlo analysis; integrated circuit interconnections; model reduction method; one-shot projection; process variations; projection matrix; Application specific integrated circuits; Delay; Frequency domain analysis; Integrated circuit interconnections; Large-scale systems; Monte Carlo methods; Sampling methods; Stochastic processes; Time domain analysis; Transfer functions;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1692590
