Title :
A resonant cantilever sensor for monitoring airborne nanoparticles
Author :
Wasisto, H.S. ; Merzsch, S. ; Stranz, A. ; Waag, A. ; Kirsch, I. ; Uhde, E. ; Salthammer, T. ; Peiner, E.
Author_Institution :
Inst. of Semicond. Technol. (IHT), Tech. Univ. Braunschweig, Braunschweig, Germany
Abstract :
In this paper, a silicon resonant cantilever sensor is used for monitoring airborne nanoparticles (NPs) by detecting the resonant frequency shift that is directly induced by an additional NPs mass deposited on it. A piezoelectric stack actuator and a self-sensing technique using a piezoresistive strain gauge are involved in the sensor system in order to actuate and detect the oscillation of cantilever sensor, respectively. The dielectrophoresis (DEP) method is employed for trapping the airborne NPs in a stable carbon aerosol assessment. A thermal-induced frequency shift is also investigated with the purpose of observing the limitation imposed by thermal effects on the minimum detectable NPs mass. The proposed sensor reveals a mass sensitivity of 8.33 Hz/ng, a fundamental resonant frequency of 43.92 kHz, a quality factor of 1230, and a temperature coefficient of the resonant frequency (TCf) of -28.6 ppm/°C. The results demonstrate a possibility of using this resonant cantilever in mobile airborne sensor applications.
Keywords :
electrophoresis; nanoparticles; piezoelectric actuators; semiconductor counters; strain gauges; airborne nanoparticle monitoring; carbon aerosol assessment; dielectrophoresis method; frequency 43.92 kHz; piezoelectric stack actuator; piezoresistive strain gauge; resonant cantilever sensor; resonant frequency shift; self-sensing technique; silicon resonant cantilever sensor; temperature coefficient; thermal effects; thermal-induced frequency shift; Carbon; Frequency measurement; Nanoparticles; Resonant frequency; Silicon; Temperature measurement; Temperature sensors; Resonant cantilever sensor; airborne nanoparticles; dielectrophoresis; resonant frequency;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0157-3
DOI :
10.1109/TRANSDUCERS.2011.5969233