• DocumentCode
    2530517
  • Title

    A microfluidic device for high frequency characterization of fluids under high dc electric fields

  • Author

    Song, C.S. ; Wang, P.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC, USA
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    2283
  • Lastpage
    2286
  • Abstract
    The design and fabrication of a broadband microwave microfluidic device are presented together with our preliminary measurement results on water dielectric saturation effects. Heavily-doped silicon is used to form microstrip lines and 250 nm deep planar microfluidic channels. The atomically smooth surfaces enable ~ 0.9 MV/cm dc electric fields across the channel without breakdown issues. High frequency scattering parameter measurements are conducted under different uniform dc electric fields. When the applied dc field is increased to ~ 0.9 MV/cm, extracted water permittivity, ε\´ and ε", are reduced by as much as 21 % and 11 %, respectively. Future work includes achieving reliable contacts and on-chip de-embedding procedures.
  • Keywords
    S-parameters; dielectric measurement; microfluidics; microstrip lines; microwave devices; broadband microwave microfluidic device; heavily-doped silicon; high dc electric fields; high frequency characterization; high frequency scattering parameter measurements; microfluidic channels; microstrip lines; water dielectric saturation effects; Dielectric measurements; Dielectrics; Electric fields; Microstrip; Silicon; Surface roughness; Surface treatment; Dielectric saturation; microfluidic; nanofabrication; transmission line;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969237
  • Filename
    5969237