DocumentCode :
2530517
Title :
A microfluidic device for high frequency characterization of fluids under high dc electric fields
Author :
Song, C.S. ; Wang, P.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC, USA
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
2283
Lastpage :
2286
Abstract :
The design and fabrication of a broadband microwave microfluidic device are presented together with our preliminary measurement results on water dielectric saturation effects. Heavily-doped silicon is used to form microstrip lines and 250 nm deep planar microfluidic channels. The atomically smooth surfaces enable ~ 0.9 MV/cm dc electric fields across the channel without breakdown issues. High frequency scattering parameter measurements are conducted under different uniform dc electric fields. When the applied dc field is increased to ~ 0.9 MV/cm, extracted water permittivity, ε\´ and ε", are reduced by as much as 21 % and 11 %, respectively. Future work includes achieving reliable contacts and on-chip de-embedding procedures.
Keywords :
S-parameters; dielectric measurement; microfluidics; microstrip lines; microwave devices; broadband microwave microfluidic device; heavily-doped silicon; high dc electric fields; high frequency characterization; high frequency scattering parameter measurements; microfluidic channels; microstrip lines; water dielectric saturation effects; Dielectric measurements; Dielectrics; Electric fields; Microstrip; Silicon; Surface roughness; Surface treatment; Dielectric saturation; microfluidic; nanofabrication; transmission line;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969237
Filename :
5969237
Link To Document :
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