DocumentCode :
2531420
Title :
Test programming in an ABBET signal-oriented environment
Author :
Jurcak, Tom
Author_Institution :
Test Eng. Syst. Group, Texas Instrum. Inc., Lewisville, TX, USA
fYear :
1996
fDate :
16-19 Sep 1996
Firstpage :
36
Lastpage :
39
Abstract :
After programming instruments for 10 years and prototyping the ABBET (IEEE-1226) signal-oriented architecture for 1 year, several side effects of programming in the ABBET environment beyond the direct benefits of instrument independence have come to light. Programming test algorithms in terms of signals and their properties is made easier through a more logical division between testing algorithms and hardware control, and also reduces the need for instrument programming manuals. Also, while defining the properties of interest in the signal being tested, explicit statement of requirements is encouraged rather than the reliance on assumptions based on the functionality of most test instrumentation. When design for testability is limited, describing the signal properties at each point in a circuit leads toward separate models of the devices interposed between the device under test and the instruments, greatly increasing test software reuse. Further, hardware idiosyncrasies such as line losses and noise insertion can also be modeled separately rather than lumping the effects into one tolerance quantity. The way in which the instrument independence was achieved facilitates the development of a virtual test set which can thoroughly and reliably prove the correct execution and error detection of the test algorithms, without using the physical test set instruments
Keywords :
automatic test software; design for testability; programming environments; signal processing; ABBET signal-oriented environment; IEEE-1226; broad based environment for test; error detection; hardware control; instrument independence; instrument programming; line losses; noise insertion; side effects; signal-oriented architecture; test algorithms; test programming; tolerance quantity; virtual test set; Circuit noise; Circuit testing; Design for testability; Hardware; Insertion loss; Instruments; Logic programming; Logic testing; Prototypes; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
ISSN :
1088-7725
Print_ISBN :
0-7803-3379-9
Type :
conf
DOI :
10.1109/AUTEST.1996.547674
Filename :
547674
Link To Document :
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