• DocumentCode
    2531420
  • Title

    Test programming in an ABBET signal-oriented environment

  • Author

    Jurcak, Tom

  • Author_Institution
    Test Eng. Syst. Group, Texas Instrum. Inc., Lewisville, TX, USA
  • fYear
    1996
  • fDate
    16-19 Sep 1996
  • Firstpage
    36
  • Lastpage
    39
  • Abstract
    After programming instruments for 10 years and prototyping the ABBET (IEEE-1226) signal-oriented architecture for 1 year, several side effects of programming in the ABBET environment beyond the direct benefits of instrument independence have come to light. Programming test algorithms in terms of signals and their properties is made easier through a more logical division between testing algorithms and hardware control, and also reduces the need for instrument programming manuals. Also, while defining the properties of interest in the signal being tested, explicit statement of requirements is encouraged rather than the reliance on assumptions based on the functionality of most test instrumentation. When design for testability is limited, describing the signal properties at each point in a circuit leads toward separate models of the devices interposed between the device under test and the instruments, greatly increasing test software reuse. Further, hardware idiosyncrasies such as line losses and noise insertion can also be modeled separately rather than lumping the effects into one tolerance quantity. The way in which the instrument independence was achieved facilitates the development of a virtual test set which can thoroughly and reliably prove the correct execution and error detection of the test algorithms, without using the physical test set instruments
  • Keywords
    automatic test software; design for testability; programming environments; signal processing; ABBET signal-oriented environment; IEEE-1226; broad based environment for test; error detection; hardware control; instrument independence; instrument programming; line losses; noise insertion; side effects; signal-oriented architecture; test algorithms; test programming; tolerance quantity; virtual test set; Circuit noise; Circuit testing; Design for testability; Hardware; Insertion loss; Instruments; Logic programming; Logic testing; Prototypes; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
  • Conference_Location
    Dayton, OH
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-3379-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1996.547674
  • Filename
    547674