DocumentCode
2531556
Title
FPGA-based Advanced Digital Signal Inspector for internal signals of pin-limited systems-on-package
Author
Mostardini, Luca ; Benvenuti, Luca ; Bacciarelli, Luca ; Fanucci, Luca ; Rosadini, Christian ; Rocchi, Alessandro ; De Marinis, M.
Author_Institution
Dept. of Inf. Eng., Univ. of Pisa, Pisa, Italy
fYear
2009
fDate
21-23 Sept. 2009
Firstpage
21
Lastpage
26
Abstract
The paper presents an Advanced Digital Signal Inspector (ADSI) used for acquisition and analysis of the internal digital of a System on Package (SoP) with a limited number of pins. The system is made of a commercial FPGA-board, connected to the module for data sampling and controlled by PC via USB; a suited graphical interface allows for configuration, multi trace real time data display and post processing. The proposed platform can be used to extract and monitor simultaneously up to 4 digital signals, and an ADC is used to monitor one additional analog signal. The ADSI has been successfully applied for the characterization of an automotive SoP based on a MEM gyro sensor interfaced to an ASIC for proper signal conditioning. The ADC was connected to an external accelerometer to evaluate the module behaviour when applying mechanical shocks.
Keywords
application specific integrated circuits; automotive electronics; data acquisition; field programmable gate arrays; integrated circuit testing; signal processing equipment; system-on-package; ADC; ADSI; ASIC; FPGA; MEM gyro senso; PC; USB; advanced digital signal inspector; application specific integrated circuits; automotive SoP; data sampling; external accelerometer; field programmable gate arrays; graphical interface; mechanical shocks; pin-limited systems-on-package; Automotive engineering; Control systems; Data mining; Displays; Packaging; Pins; Real time systems; Signal analysis; Signal sampling; Universal Serial Bus;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2009. IDAACS 2009. IEEE International Workshop on
Conference_Location
Rende
Print_ISBN
978-1-4244-4901-9
Electronic_ISBN
978-1-4244-4882-1
Type
conf
DOI
10.1109/IDAACS.2009.5343033
Filename
5343033
Link To Document