DocumentCode :
2531637
Title :
Mechanical and electrical evaluation for the long-term stability of implanted 3D retinal microelectrode
Author :
Hong, S. ; Lee, S. ; Yoo, H. ; Ahn, J. ; Park, S. ; Koo, K. ; Cho, D.
Author_Institution :
Inter-Univ. Semicond. Res. Center (ISRC), Nat. Univ., Seoul, South Korea
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
202
Lastpage :
205
Abstract :
In this paper, the mechanical and electrical characteristics of 3D microelectrode are presented to provide the long-term stability of the implanted microelectrode. As the dimensions of the microelectrode become smaller, the microelectrode can be easily damaged by mechanical pressure and over-injected electric charge. In order to avoid these destructions, allowable mechanical and electrical stress should be determined. Experiments for durability evaluation are set up and performed to measure the mechanical force and safe charge injection limit. The result of the experiments shows that the allowable mechanical force in vertical and horizontal direction is 0.8165 N and 0.2068 N, respectively. In the charge injection test, it is observed that the density of injected charge is a prior factor in microelectrode dissolution rather than the total amount of injected charge.
Keywords :
bioelectric phenomena; biomechanics; biomedical electrodes; eye; microelectrodes; prosthetics; durability evaluation; electrical stress; implanted 3D retinal microelectrode; mechanical force; mechanical pressure; mechanical stress; microelectrode dissolution; microelectrode electrical evaluation; microelectrode long term stability; microelectrode mechanical evaluation; over injected electric charge; safe charge injection limit; Fabrication; Force; Gold; Microelectrodes; Retina; Stress; Three dimensional displays; Mechanical and Electrical Durability Evaluation; Microelectrode; Retinal Prosthesis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969312
Filename :
5969312
Link To Document :
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