• DocumentCode
    2531910
  • Title

    The contribution to the non-uniform distribution of motion effects obtained for the SC-cut quartz plates

  • Author

    Mateescu, I. ; Zelenka, Jan

  • Author_Institution
    Inst. of Phys. & Technol. of Mater., Bucharest
  • fYear
    1996
  • fDate
    5-7 Jun 1996
  • Firstpage
    405
  • Lastpage
    411
  • Abstract
    New experimental results related to the harmonic dependence of the characteristics of SC-cut quartz resonators on various material and electrode parameters are presented. On the basis of the analysis of SC-cut trapped-energy resonators vibrating in the coupled thickness-shear and thickness-twist in the vicinity of the fundamental and odd overtone thickness-shear frequency dependencies were established of effective mass-loading, effective coupling coefficient, motional capacitance and static capacitance on electrode material and dimensions. The results put into evidence the influence of the non-uniform distribution of motion on behaviour of the SC-cut resonators. The plane-parallel polished SC-cut quartz plate of 14 mm diameter with different thickness Ag and CrAu electrodes and two values of electrode diameter were used for the experimental investigations
  • Keywords
    capacitance; crystal resonators; electrodes; quartz; SC-cut quartz plates; SiO2; coupled thickness-shear; effective coupling coefficient; effective mass-loading; electrode diameter; electrode parameters; harmonic dependence; motion effects; motional capacitance; nonuniform distribution; overtone; plane-parallel polished quartz plate; quartz resonators; static capacitance; thickness-shear frequency dependencies; thickness-twist; trapped-energy resonators; Admittance; Capacitance; Coupling circuits; Electrodes; Frequency measurement; Harmonic analysis; Motion analysis; Physics; Resonance; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-3309-8
  • Type

    conf

  • DOI
    10.1109/FREQ.1996.559888
  • Filename
    559888