• DocumentCode
    2531970
  • Title

    Analysis of the LS estimation error for a MIMO system on a Rician fading channel

  • Author

    Kumar, Jovin Vasanth ; Bhattacharjee, Ratnajit

  • Author_Institution
    Dept. of Electron. & Commun., Indian Inst. of Technol., Guwahati
  • fYear
    2008
  • fDate
    19-21 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Coherent detection techniques require the channel information for the symbol detection and such techniques are reported to have better performance than the non coherent ones. Method of Least Squares (LS) is a popular technique for performing channel estimation. The LS Estimation method requires the channel to be constant through out the estimation period. In reality, the wireless channel is time varying and we will always get an estimation error when we estimate the channel with block techniques like the LS Estimation. Moreover, the channel is affected by noise and this will also add some error in estimation. MIMO system, which offers gain in capacity, is an area of recent interest. Analysis of LS estimation error for SISO Rayleigh channel is available in literature. Approximate analytical expressions for the variance of the error for a Rician fading channel for a MIMO system is presented here. The validity of the expression has been checked through computer simulation.
  • Keywords
    MIMO communication; Rayleigh channels; Rician channels; channel capacity; channel estimation; error statistics; least squares approximations; wireless channels; MIMO system; Rician fading channel; SISO Rayleigh channel; block technique; channel capacity; coherent detection technique; least square estimation error; wireless channel estimation; Channel capacity; Channel estimation; Error analysis; Estimation error; Least squares approximation; MIMO; Rayleigh channels; Rician channels; Transmitters; Transmitting antennas; Estimation error; Least squares; MIMO; Rician fading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2008 - 2008 IEEE Region 10 Conference
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4244-2408-5
  • Electronic_ISBN
    978-1-4244-2409-2
  • Type

    conf

  • DOI
    10.1109/TENCON.2008.4766811
  • Filename
    4766811