Title :
InP-based photodetector bonded on CMOS with Si3N4 interconnect waveguides
Author :
Binetti, P.R.A. ; Leijtens, X.J.M. ; Ripoll, A. Morant ; de Vries, T. ; Smalbrugge, E. ; Oei, Y.S. ; Di Cioccio, L. ; Fedeli, J.M. ; Lagahe, C. ; Orobtchouk, R. ; Van Thourhout, D. ; van Veldhoven, P.J. ; Nötzel, R. ; Smit, M.K.
Author_Institution :
COBRA Res. Inst., Tech. Univ. Eindhoven, Eindhoven, Netherlands
Abstract :
We developed an InP-based photodetector which was bonded on a CMOS wafer containing a Si3N4-wiring photonic circuit. The detector fabrication is compatible with wafer scale processing steps, guaranteeing compatibility towards future generation electronic IC processing. Integration technology and experimental results are presented in this paper.
Keywords :
CMOS integrated circuits; integrated circuit interconnections; photodetectors; waveguides; CMOS wafer; InP; Si3N4; integration technology; interconnect waveguides; photodetector; photonic circuit; wafer scale processing; wiring; Absorption; Indium phosphide; Integrated circuit interconnections; Optical buffering; Optical device fabrication; Optical interconnections; Optical waveguides; Photodetectors; Photonic integrated circuits; Wafer bonding;
Conference_Titel :
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location :
Belek-Antalya
Print_ISBN :
978-1-4244-3680-4
Electronic_ISBN :
1092-8081
DOI :
10.1109/LEOS.2009.5343085