DocumentCode
2532245
Title
Infrared spectroscopy in the investigation of stressed insulator surfaces
Author
Hepburn, D.M.
Author_Institution
Glasgow Caledonian Univ., UK
fYear
1998
fDate
35817
Firstpage
42644
Lastpage
42646
Abstract
Attenuated Total Reflectance FTIR spectroscopy can be used in initial examination of stressed polymeric insulation surfaces, to confirm/determine chemical structure. Although there are some situations in which the shallow depth of investigation can be a drawback, the strengths of the technique offer users a greater insight into the chemical changes occurring at a material surface than traditional methods. The technique can also be used for forensic examination of failed components. New accessories may provide the industrial user with alternative nondestructive methods of checking the surface state of components
Keywords
polymers; Attenuated Total Reflectance FTIR spectroscopy; chemical structure; stressed polymeric insulator surface;
fLanguage
English
Publisher
iet
Conference_Titel
Surface Phenomena Affecting Insulator Performance (Ref. No. 1998/235), IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19980223
Filename
668740
Link To Document