Title :
Infrared spectroscopy in the investigation of stressed insulator surfaces
Author_Institution :
Glasgow Caledonian Univ., UK
Abstract :
Attenuated Total Reflectance FTIR spectroscopy can be used in initial examination of stressed polymeric insulation surfaces, to confirm/determine chemical structure. Although there are some situations in which the shallow depth of investigation can be a drawback, the strengths of the technique offer users a greater insight into the chemical changes occurring at a material surface than traditional methods. The technique can also be used for forensic examination of failed components. New accessories may provide the industrial user with alternative nondestructive methods of checking the surface state of components
Keywords :
polymers; Attenuated Total Reflectance FTIR spectroscopy; chemical structure; stressed polymeric insulator surface;
Conference_Titel :
Surface Phenomena Affecting Insulator Performance (Ref. No. 1998/235), IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19980223