• DocumentCode
    2532245
  • Title

    Infrared spectroscopy in the investigation of stressed insulator surfaces

  • Author

    Hepburn, D.M.

  • Author_Institution
    Glasgow Caledonian Univ., UK
  • fYear
    1998
  • fDate
    35817
  • Firstpage
    42644
  • Lastpage
    42646
  • Abstract
    Attenuated Total Reflectance FTIR spectroscopy can be used in initial examination of stressed polymeric insulation surfaces, to confirm/determine chemical structure. Although there are some situations in which the shallow depth of investigation can be a drawback, the strengths of the technique offer users a greater insight into the chemical changes occurring at a material surface than traditional methods. The technique can also be used for forensic examination of failed components. New accessories may provide the industrial user with alternative nondestructive methods of checking the surface state of components
  • Keywords
    polymers; Attenuated Total Reflectance FTIR spectroscopy; chemical structure; stressed polymeric insulator surface;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Surface Phenomena Affecting Insulator Performance (Ref. No. 1998/235), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19980223
  • Filename
    668740