DocumentCode :
2532245
Title :
Infrared spectroscopy in the investigation of stressed insulator surfaces
Author :
Hepburn, D.M.
Author_Institution :
Glasgow Caledonian Univ., UK
fYear :
1998
fDate :
35817
Firstpage :
42644
Lastpage :
42646
Abstract :
Attenuated Total Reflectance FTIR spectroscopy can be used in initial examination of stressed polymeric insulation surfaces, to confirm/determine chemical structure. Although there are some situations in which the shallow depth of investigation can be a drawback, the strengths of the technique offer users a greater insight into the chemical changes occurring at a material surface than traditional methods. The technique can also be used for forensic examination of failed components. New accessories may provide the industrial user with alternative nondestructive methods of checking the surface state of components
Keywords :
polymers; Attenuated Total Reflectance FTIR spectroscopy; chemical structure; stressed polymeric insulator surface;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Surface Phenomena Affecting Insulator Performance (Ref. No. 1998/235), IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19980223
Filename :
668740
Link To Document :
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