Title :
Analysis of the effects of a high power electronics controller on electrical Grids during faulted and post-faulted conditions using wavelets
Author :
Reyes-Archundia, Enrique ; Moreno-Goytia, Edgar L.
Author_Institution :
Inst. Tecnol. de Morelia, Morelia, Mexico
Abstract :
FACTS controllers and HVDC links are high power electronics-based structures which have shown its strength in improving the operation and control of nowadays electrical networks worldwide. Alongside the many benefits they provide, there are also collateral effects on the grid as consequence of dynamically deviating localized network parameters, which affects the protection system for instance. This paper reviews some effects of the STATCOM, TCSC and UPFC on equivalent parameters of the grid on faulted and non-faulted conditions. As main point, this paper also analyses the dynamic effects of the TCSC on the equivalent reactance of the neighborhood of the controller in the transit from pre-faulted to faulted condition. The steady state waveforms and those from the transient oscillations emerged during the faulted state are processed using wavelets to determinate effective protection and control actions. The results presented have been obtained by combining the capabilities of PSCAD and MATLAB-Simulink.
Keywords :
HVDC power transmission; flexible AC transmission systems; power electronics; power grids; power system CAD; power transmission control; power transmission faults; static VAr compensators; wavelet transforms; FACTS controllers; HVDC links; MATLAB-Simulink; PSCAD; STATCOM; TCSC; UPFC; electrical grids; electrical networks; high power electronics controller; localized network parameters; post-faulted conditions; protection system; steady state waveforms; transient oscillations; wavelets; Approximation methods; Impedance; Power capacitors; Power transmission lines; Thyristors; Wavelet transforms; High Power Electronics Controllers; Thyristor Controlled Series Capacitor (TCSC); Wavelet Transform;
Conference_Titel :
Power Electronics Congress (CIEP), 2010 12th International
Conference_Location :
San Luis Potosi
Print_ISBN :
978-1-4244-8066-1
DOI :
10.1109/CIEP.2010.5598905