DocumentCode
253264
Title
New ISFET interface circuits with noise reduction capability
Author
Das, M.P. ; Bhuyan, M.
Author_Institution
Dept. of EEE, IIT Guwahati, Guwahati, India
fYear
2014
fDate
9-11 May 2014
Firstpage
1
Lastpage
6
Abstract
In this paper three different noise reduction techniques for Ion Sensitive Field Effect Transistor (ISFET) readout configuration and their comparison is presented. The proposed circuit configurations are immune to the noise generated from the ISFET sensory system and particularly to the low frequency pH dependent 1/f electrochemical noise. The methods used under these studies are- Compensation of noise by differential techniques (Implemented in LabVIEW environment and with OPAMP based circuit) and compensation by Wheatstone bridge method. Here two identical commercial ISFET sensors from Microsens were used. The statistical and frequency analysis of the data generated by the proposed methods were compared for different pH value ranging from pH-2 to pH 10 under room temperature, and it is found that the interface circuits are able to compensate the noise to a great extent.
Keywords
1/f noise; interference suppression; ion sensitive field effect transistors; statistical analysis; 1/f electrochemical noise; ISFET interface circuits; ISFET sensory system; Microsens; Wheatstone bridge method; frequency analysis; ion sensitive field effect transistor; low frequency pH; noise reduction techniques; statistical analysis; Bridge circuits; Junctions; Sensors; ISFET; Wheatstone-Bridge; electrochemical sensor; noise compensation;
fLanguage
English
Publisher
ieee
Conference_Titel
Recent Advances and Innovations in Engineering (ICRAIE), 2014
Conference_Location
Jaipur
Print_ISBN
978-1-4799-4041-7
Type
conf
DOI
10.1109/ICRAIE.2014.6909263
Filename
6909263
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