Title :
Step response calculation of VLSI low loss interconnect using S-parameters
Author :
Bandurski, Wojciech ; Wardzinska, Agnieszka
Author_Institution :
Multimedia Telecommun. & Microelectron., Poznan Univ. of Technol., Poznan, Poland
Abstract :
This document describes step response calculation based on scattering parameters. To obtain the analytical formula of step response we approximate S-parameters and then introduce some simplification in step response formula. We present the results of simulation of VLSI interconnect, the RLC parameters are calculated using IE3D.
Keywords :
S-parameters; VLSI; integrated circuit interconnections; step response; IE3D; RLC parameters; S-parameters; VLSI low loss interconnect; scattering parameters; step response calculation; Approximation methods; Integrated circuit interconnections; Integrated circuit modeling; Load modeling; Power transmission lines; Scattering parameters; Very large scale integration;
Conference_Titel :
Signals and Electronic Systems (ICSES), 2012 International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
978-1-4673-1710-8
Electronic_ISBN :
978-1-4673-1709-2
DOI :
10.1109/ICSES.2012.6382238
