• DocumentCode
    2532891
  • Title

    The analysis of power quality effects from the transformer inrush current: A case study of the Jeju power system, Korea

  • Author

    Seo, H.C. ; Kim, C.H.

  • Author_Institution
    Korea Electr. Eng.&Sci. Res. Inst., Seoul
  • fYear
    2008
  • fDate
    20-24 July 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The transformer inrush current can cause a voltage drop by source impedance. This current can impact sensitive loads by the voltage drop. Therefore, it is necessary to take measures to limit this inrush current. Accurate modeling and analysis for inrush current is the first step in developing a technique to take practical measures. This study, described in this paper, analyzes the power quality affected by transformer inrush current using the Jeju power system in Korea. The Electromagnetic Transients Program (EMTP) is used to analyze the transient phenomenon. We discuss a method to model the hysteresis curve of the transformer in EMTP. We carried out various simulations to analyze the power quality during transformer energization. The analysis results of voltage drop by the inrush current occurrence when certain requirements are met are presented.
  • Keywords
    EMTP; fault currents; power supply quality; power transformers; EMTP; Jeju power system; Korea; electromagnetic transients program; power quality effects; source impedance; transformer energization; transformer inrush current; transient phenomenon; voltage drop; Current measurement; EMTP; Electromagnetic measurements; Power quality; Power system analysis computing; Power system measurements; Power system modeling; Power system simulation; Power system transients; Surges; EMTP; Hysteresis modeling; Jeju; Transformer Inrush current; Voltage drop;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    1932-5517
  • Print_ISBN
    978-1-4244-1905-0
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2008.4596173
  • Filename
    4596173