DocumentCode :
2532891
Title :
The analysis of power quality effects from the transformer inrush current: A case study of the Jeju power system, Korea
Author :
Seo, H.C. ; Kim, C.H.
Author_Institution :
Korea Electr. Eng.&Sci. Res. Inst., Seoul
fYear :
2008
fDate :
20-24 July 2008
Firstpage :
1
Lastpage :
6
Abstract :
The transformer inrush current can cause a voltage drop by source impedance. This current can impact sensitive loads by the voltage drop. Therefore, it is necessary to take measures to limit this inrush current. Accurate modeling and analysis for inrush current is the first step in developing a technique to take practical measures. This study, described in this paper, analyzes the power quality affected by transformer inrush current using the Jeju power system in Korea. The Electromagnetic Transients Program (EMTP) is used to analyze the transient phenomenon. We discuss a method to model the hysteresis curve of the transformer in EMTP. We carried out various simulations to analyze the power quality during transformer energization. The analysis results of voltage drop by the inrush current occurrence when certain requirements are met are presented.
Keywords :
EMTP; fault currents; power supply quality; power transformers; EMTP; Jeju power system; Korea; electromagnetic transients program; power quality effects; source impedance; transformer energization; transformer inrush current; transient phenomenon; voltage drop; Current measurement; EMTP; Electromagnetic measurements; Power quality; Power system analysis computing; Power system measurements; Power system modeling; Power system simulation; Power system transients; Surges; EMTP; Hysteresis modeling; Jeju; Transformer Inrush current; Voltage drop;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
Conference_Location :
Pittsburgh, PA
ISSN :
1932-5517
Print_ISBN :
978-1-4244-1905-0
Electronic_ISBN :
1932-5517
Type :
conf
DOI :
10.1109/PES.2008.4596173
Filename :
4596173
Link To Document :
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