• DocumentCode
    2533102
  • Title

    The complication of helium desorption in the helium leak method

  • Author

    Wickard, Timothy E. ; Hanson, William P.

  • Author_Institution
    Piezo Crystal Co., Carlisle, PA, USA
  • fYear
    1996
  • fDate
    5-7 Jun 1996
  • Firstpage
    501
  • Lastpage
    508
  • Abstract
    The phenomenon of helium adsorption on the glass and metal surfaces of the standard HC-37/U cold weld base is investigated. Testing laboratories implement the interpretation of MIL-STD-202 method 112 in various ways. These methods are compared. A comparison of the leak rate of bombed units (units subjected to high pressure of known tracer gas) is made against units which are back filled with the same tracer gas, helium. The difference in the leak rate due to helium adsorption in the base is shown and the decay curve for the helium desorption of the HC-37/u base is given. Techniques for purging helium from the glass surface are also investigated and the results given
  • Keywords
    ageing; crystal resonators; desorption; leak detection; packaging; standards; MIL-STD-202 method 112; bombed units; cold weld base; crystal resonators; decay curve; desorption; helium leak method; leak rate; packaging; standard HC-37/U; tracer gas; Equations; Gases; Glass; Helium; Laboratories; Packaging; Performance evaluation; Process control; Testing; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-3309-8
  • Type

    conf

  • DOI
    10.1109/FREQ.1996.559902
  • Filename
    559902